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IEEE Xplore: Design & Test of Computers, IEEE
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IEEE Design & Test
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IEEE Design & Test of Computers - Wikipedia, the free encyclopedia
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Welcome to IEEE Xplore 2.0: Design & Test of Computers, IEEE
Guest editors' introduction: benchmarking for design and test. Davidson, S.; Harlow, J. ... Semicustom design of an IEEE 1394-compliant reusable IC core ...
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IEEE Design & Test
July/August 2008 Design in the Late- and Post-Silicon Eras TABLE OF CONTENTS ISSUE HIGHLIGHTS: Guest Editors' Introduction: System IC Design Challenges beyond 32 nm

IEEE Computer Society Online Store - Design & Test
IEEE Computer Society CS Store - Design and Test ... DFT 2007- 22nd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems     NEW !

IEEE Xplore: Design & Test of Computers, IEEE
Frequency: 6 ISSN: 0740-7475 Subject Category: General/Other (Computer Engineering) Published by: IEEE Computer Society ...

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IEEE Design and Test of Computers - Published Articles
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IEEE Computer Society::Design and Testing
by Parimal Pal Chaudhuri, Dipanwita Roy Chowdhury, Sukumar Nandi, Santanu Chattopadhyay

IEEE Computer Society Books
31st Asilomar Conference on Signals, Systems and Computers [CD-ROM] IEEE Design & Test of Computers IEEE Micro

IEEE Design & Test of Computers - Wikipedia, the free encyclopedia
IEEE Design & Test of Computers, or IEEE Design & Test, or simply Design & Test, is a magazine published by the Circuits and Systems Society, the Computer Society, and the Council ...